Characterization using Phase-Contrast Enhanced X-Ray Imaging

Summary form only given. We demonstrate phase-contrast enhanced X-ray imaging (PCXI) for characterization of the solid deuterium-tritium surface inside of beryllium shells. This novel method of X-ray imaging takes advantage of the small refraction and diffraction of the X-rays at boundaries between materials. PCXI is more sensitive to small density changes in low atomic number materials than traditional absorption radiography. Point-projection X-ray microscopes were used in our laboratory to study the surface roughness of a solid deuterium-tritium layer inside of a beryllium capsule. This method can also be applied to plasma physics characterization