DocumentCode
2568808
Title
Monochromatic X-Ray Self-Emission Imaging of Imploding Wire Array Z-Pinches on the Z Accelerator
Author
Jones, B. ; Deeney, C. ; Coverdale, C.A. ; Mazarakis, M. ; Meyer, C. ; LePell, P.D.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM
fYear
2005
fDate
20-23 June 2005
Firstpage
180
Lastpage
180
Abstract
Summary form only given. A monochromatic X-ray self-emission imaging diagnostic has been developed for the Z accelerator, which drives 20 MA in 100 ns to implode wire array Z-pinches, generating 200 TW of soft X-ray radiation. This instrument reflects eight pinhole images from a flat Cr/C multilayer mirror (MLM) onto a 1 ns time-resolved microchannel plate detector. The MLM reflects 277 eV photons with 5 eV FWHM bandwidth and 20% peak reflectivity, and an aluminized parylene filter shields the detector from visible light. High-energy bremsstrahlung X-rays do not follow the reflected beam path, and so the background on the shielded detector is reduced compared to a standard pinhole camera. Additionally, the MLM-reflected images offer spectral resolution that filtration alone cannot. Adjacent to this instrument in the same beamline is a second eight-frame standard pinhole camera filtered to image keV photons simultaneously. Initial data on Z from W, Cu, and stainless steel wire arrays will be presented. Observed phenomena including implosion instabilities, zippering and hollow features in the plasma column during the onset of stagnation, accretion of trailing colder mass, and cathode re-emission will be discussed. Future work will extend monochromatic imaging to higher photon energies, including several-keV K-shell sources
Keywords
Z pinch; bremsstrahlung; copper; exploding wires; explosions; plasma X-ray sources; plasma diagnostics; plasma instability; stainless steel; tungsten; 100 ns; 20 MA; 200 TW; 277 eV; Cu; K-shell sources; W; Z accelerator; aluminized parylene filter; high-energy bremsstrahlung X-rays; imploding wire array Z-pinches; implosion instabilities; monochromatic X-ray self-emission imaging; multilayer mirror; pinhole camera; soft X-ray radiation; time-resolved microchannel plate detector; zippering; Acceleration; Cameras; Chromium; Instruments; Microchannel; Mirrors; Nonhomogeneous media; Optical imaging; Wire; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
Conference_Location
Monterey, CA
ISSN
0730-9244
Print_ISBN
0-7803-9300-7
Type
conf
DOI
10.1109/PLASMA.2005.359193
Filename
4198452
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