DocumentCode
2569241
Title
Accurate continuous monitoring using ISFET-based biosensors based on characterization and modeling of drift and low frequency noise
Author
Jamasb, Shahriar ; Churchil, John N. ; Collins, Scott D. ; Smith, Rosemary L.
Author_Institution
Commquest, Encinitas, CA, USA
Volume
6
fYear
1998
fDate
29 Oct-1 Nov 1998
Firstpage
2864
Abstract
The merit of a recently reported method for correction of drift in pH-sensitive ISFETs (S. Jamasb et al., 1997) is further examined by considering the distinction between drift and low-frequency noise. A physical model for drift in pH-sensitive ISFETs has been employed to isolate the low frequency noise associated with these devices. Characterization of the low-frequency noise behavior of ISFET-based biosensors, is particularly relevant to the applicability of the proposed method which is based on monitoring the differential of the sensor output signal over sufficiently small intervals of time. The validity of the reported corrective scheme for continuous monitoring of pH is experimentally confirmed under conditions approximating acute metabolic acidosis using a Si3N4-gate pH-sensitive ISFET whose noise spectrum was characterized a priori. The theoretical and experimental results presented in this work have a direct bearing on ISFET-based biosensors which detect a local pH change using a pH-sensitive ISFET, such as ISFET glucose sensors
Keywords
biosensors; ion sensitive field effect transistors; modelling; monitoring; pH measurement; ISFET glucose sensors; ISFET-based biosensors; Si3N4; Si3N4-gate pH-sensitive ISFET; accurate continuous monitoring; acute metabolic acidosis; drift; low frequency noise; noise spectrum; Amperometric sensors; Biomedical signal processing; Biosensors; Chemical and biological sensors; Chemical sensors; Chemical technology; Low-frequency noise; Monitoring; Sensor phenomena and characterization; Sugar;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
Conference_Location
Hong Kong
ISSN
1094-687X
Print_ISBN
0-7803-5164-9
Type
conf
DOI
10.1109/IEMBS.1998.746082
Filename
746082
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