Title :
Path loss revisited using computer simulation
Author :
Khong, Hung Huy ; Kwan, Bing W. ; Tung, Leonard J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Florida State Univ., Tallahassee, FL, USA
Abstract :
In this paper, we propose a computer simulation model for the study of the large-scale effects on narrowband wireless transmission systems. The development of the path loss model is based on the ray tracing technique. This study concentrates on the first-order scattering effects, namely each multipath signal is a two-hop signal that involves a single scattering object. The first hop is directed toward the scatterer from the transmitter; and the second hop goes from the scatterer to the receiver. For each hop the signal is described using a two-ray model accounting for wave propagation along the direct path and along the ground-reflected path. The simulation results are consistent with the empirical models that are derived from measurements, including the Hata model and the Lee model. More importantly, two key observations are made: First, the path loss is affected by the number of scattering objects, their radar cross sections, and the ground reflection. Second, coherent multipath signals can cause the path-loss exponent falling below 2, which corresponds to free-space propagation.
Keywords :
electromagnetic wave scattering; radar cross-sections; radiocommunication; radiowave propagation; ray tracing; Hata model; Lee model; computer simulation model; first-order scattering effect; ground reflection; large-scale effect; multipath signal; narrowband wireless transmission system; path loss model; radar cross section; ray tracing technique; scattering objects; two-ray model; wave propagation; Analytical models; Computer simulation; Mathematical model; Narrowband; Predictive models; Propagation losses; Radar cross section; Radar scattering; Ray tracing; Reflection; narrowband; path loss; ray tracing;
Conference_Titel :
Systems, Man and Cybernetics, 2009. SMC 2009. IEEE International Conference on
Conference_Location :
San Antonio, TX
Print_ISBN :
978-1-4244-2793-2
Electronic_ISBN :
1062-922X
DOI :
10.1109/ICSMC.2009.5346175