• DocumentCode
    2569452
  • Title

    Structural enhanced information to detect features in competitive learning

  • Author

    Kamimura, Ryotaro

  • Author_Institution
    IT Educ. Center, Tokai Univ., Hiratsuka, Japan
  • fYear
    2009
  • fDate
    11-14 Oct. 2009
  • Firstpage
    3395
  • Lastpage
    3401
  • Abstract
    In this paper, we propose structural enhanced information for detecting and visualizing main features in input patterns. We have so far proposed information enhancement for feature detection, where, if we want to focus upon components such as units and connection weights and interpret the functions of the components, we have only to enhance competitive units with the components. Though this information enhancement has given favorable results in feature detection, we further refine the information enhancement and propose structural enhanced information. In structural enhanced information, three types of enhanced information can be differentiated, that is, first-, second-and third-order enhanced information. The first-order information is related to the enhancement of competitive units themselves in a competitive network, and the second-order information is dependent upon the enhancement of competitive units with input patterns. Then, the third-order information is obtained by subtracting the effect of the first-order information from the second-order information. Thus, the third-order information more explicitly represents information on input patterns. With this structural enhanced information, we can estimate more detailed features in input patterns. For demonstrating explicitly and intuitively the improved performance of our method, the conventional SOM was used, and we transformed competitive unit outputs so as to improve visualization. The method was applied to the Johns Hopkins University Ionosphere database. In the problem, we succeeded in visualizing the detailed and important features of input patterns by using the third-order information.
  • Keywords
    feature extraction; probability; self-organising feature maps; unsupervised learning; Johns Hopkins University Ionosphere database; SOM; competitive learning; competitive neural network; competitive unit; first-order information enhancement; pattern feature detection; pattern feature visualization; probability; second-order information enhancement; structural information enhancement; third-order information enhancement; Computer vision; Cybernetics; Data mining; Information processing; Input variables; Ionosphere; Mutual information; Neurons; USA Councils; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man and Cybernetics, 2009. SMC 2009. IEEE International Conference on
  • Conference_Location
    San Antonio, TX
  • ISSN
    1062-922X
  • Print_ISBN
    978-1-4244-2793-2
  • Electronic_ISBN
    1062-922X
  • Type

    conf

  • DOI
    10.1109/ICSMC.2009.5346185
  • Filename
    5346185