DocumentCode
2569452
Title
Structural enhanced information to detect features in competitive learning
Author
Kamimura, Ryotaro
Author_Institution
IT Educ. Center, Tokai Univ., Hiratsuka, Japan
fYear
2009
fDate
11-14 Oct. 2009
Firstpage
3395
Lastpage
3401
Abstract
In this paper, we propose structural enhanced information for detecting and visualizing main features in input patterns. We have so far proposed information enhancement for feature detection, where, if we want to focus upon components such as units and connection weights and interpret the functions of the components, we have only to enhance competitive units with the components. Though this information enhancement has given favorable results in feature detection, we further refine the information enhancement and propose structural enhanced information. In structural enhanced information, three types of enhanced information can be differentiated, that is, first-, second-and third-order enhanced information. The first-order information is related to the enhancement of competitive units themselves in a competitive network, and the second-order information is dependent upon the enhancement of competitive units with input patterns. Then, the third-order information is obtained by subtracting the effect of the first-order information from the second-order information. Thus, the third-order information more explicitly represents information on input patterns. With this structural enhanced information, we can estimate more detailed features in input patterns. For demonstrating explicitly and intuitively the improved performance of our method, the conventional SOM was used, and we transformed competitive unit outputs so as to improve visualization. The method was applied to the Johns Hopkins University Ionosphere database. In the problem, we succeeded in visualizing the detailed and important features of input patterns by using the third-order information.
Keywords
feature extraction; probability; self-organising feature maps; unsupervised learning; Johns Hopkins University Ionosphere database; SOM; competitive learning; competitive neural network; competitive unit; first-order information enhancement; pattern feature detection; pattern feature visualization; probability; second-order information enhancement; structural information enhancement; third-order information enhancement; Computer vision; Cybernetics; Data mining; Information processing; Input variables; Ionosphere; Mutual information; Neurons; USA Councils; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man and Cybernetics, 2009. SMC 2009. IEEE International Conference on
Conference_Location
San Antonio, TX
ISSN
1062-922X
Print_ISBN
978-1-4244-2793-2
Electronic_ISBN
1062-922X
Type
conf
DOI
10.1109/ICSMC.2009.5346185
Filename
5346185
Link To Document