• DocumentCode
    2569699
  • Title

    A robust chemometrics approach to inferential estimation of supersaturation

  • Author

    Togkalidou, Timokleia ; Fujiwara, Masamichi ; Patel, Shefali ; Braatz, Richard D.

  • Author_Institution
    Illinois Univ., Urbana, IL, USA
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1732
  • Abstract
    The fundamental processes of crystal nucleation and growth are strongly dependent on the concentration of the solute in solution. A significant limitation to the development of reliable rigorous techniques for the modeling, design, and control of crystallization processes has been the difficulty in obtaining highly accurate supersaturation measurements for dense suspensions. Attenuated total reflectance (ATR) Fourier transform infrared (FTIR) spectroscopy is coupled with robust chemometrics analysis to provide highly accurate online supersaturation estimation in dense crystal slurries. Supersaturation estimates constructed from robust chemometrics techniques are substantially more accurate than using the conventional approaches for FTIR data analysis
  • Keywords
    Fourier transform spectroscopy; attenuated total reflection; crystal growth from solution; crystallisation; infrared spectroscopy; nucleation; spectroscopy computing; suspensions; attenuated total reflectance FTIR spectroscopy; crystal growth; crystal nucleation; crystallization process control; crystallization process design; crystallization process modelling; dense crystal slurries; dense suspensions; highly accurate supersaturation measurements; inferential estimation; online supersaturation estimation; robust chemometrics approach; solute concentration; solution; supersaturation; Crystallization; Data analysis; Fourier transforms; Infrared spectra; Process control; Reflectivity; Robustness; Slurries; Spectroscopy; Suspensions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2000. Proceedings of the 2000
  • Conference_Location
    Chicago, IL
  • ISSN
    0743-1619
  • Print_ISBN
    0-7803-5519-9
  • Type

    conf

  • DOI
    10.1109/ACC.2000.879498
  • Filename
    879498