• DocumentCode
    2569925
  • Title

    A 14:1 dynamic MUX FF with select activity detection

  • Author

    Sumita, M. ; Wada, Tomotaka

  • fYear
    2006
  • fDate
    6-9 Feb. 2006
  • Firstpage
    1775
  • Lastpage
    1784
  • Abstract
    A 14:1 dynamic MUX FF is discussed. The design uses 2 cascaded dynamic stages to investigate the 14:1 MUX with a dynamic FF. In addition, replication is used to maintain latch state when all selects are inactive. The timing of the MUX FF is evaluated with a proposed slew detector. Fabricated in a 90nm CMOS process, the chip has a 2times speed increase and 70% area reduction compared to conventional methods
  • Keywords
    CMOS logic circuits; flip-flops; 90 nm; CMOS process; dynamic MUX flip flop; select activity detection; slew detector; Circuit faults; Delay; Hazards; Logic circuits; MOS devices; Pipeline processing; Registers; Signal processing; Switches; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    1-4244-0079-1
  • Type

    conf

  • DOI
    10.1109/ISSCC.2006.1696234
  • Filename
    1696234