• DocumentCode
    2570009
  • Title

    Spectroscopic Modeling and Comparison of Radiation from X-Pinches and Wire Arrays Produced on the 1 MA Pulsed Power Generator at UNR

  • Author

    Safronova, A. ; Kantsyrev, V. ; Ouart, N. ; Yilmaz, Ferkan ; Esaulov, A. ; Fedin, Dmitry ; Astanovitsky, A. ; LeGalloudec, B. ; Batie, S. ; Cowan, T. ; Jones, B. ; Coverdale, C. ; Deeney, C. ; LePell, D.

  • Author_Institution
    Dept. of Phys., Nevada Univ., Reno, NV
  • fYear
    2005
  • fDate
    20-23 June 2005
  • Firstpage
    219
  • Lastpage
    219
  • Abstract
    Summary form only given. X-ray spectra and images from Al (with 5% of Mg and some with 5% of NaF dopants) and Cu (pure and with 4% of Ni) wire arrays and X-pinches were accumulated in experiments on the 1 MA pulsed power generator at UNR. In particular, axially and radially resolved K-shell X-ray spectra of Al, Mg, and Na and L-shell X-ray spectra of Cu and Ni were recorded by a KAP crystal (in a spectral region from 6 to 15 Aring) through different slits from 50 mum to 3 mm. In addition, spatially integrated harder X-ray spectra were monitored by a LiF crystal. Non-LTE kinetic models of Al, Mg, and Na, and of Cu and Ni provided spatially resolved electron temperatures and densities for experiments with Al and Cu loads, respectively. Advantages of using alloys and dopants with small concentrations for spectroscopic plasma diagnostics will be presented. Dependence of the plasma´s spatial structures, temperatures, and densities from wire material and load configurations, sizes, and masses will be discussed
  • Keywords
    Z pinch; aluminium alloys; copper alloys; magnesium alloys; nickel alloys; plasma X-ray sources; plasma density; plasma diagnostics; plasma kinetic theory; plasma temperature; 1 MA; 50 to 3000 mum; 6 to 15 angstrom; AlMg; CuNi; K-shell X-ray spectra; KAP crystal; L-shell X-ray spectra; LiF crystal; X-pinches; electron densities; electron temperatures; kinetic models; pulsed power generator; spectroscopic plasma diagnostics; wire arrays; Monitoring; Plasma diagnostics; Plasma temperature; Power generation; Pulse generation; Semiconductor process modeling; Spatial resolution; Spectroscopy; Wire; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
  • Conference_Location
    Monterey, CA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-9300-7
  • Type

    conf

  • DOI
    10.1109/PLASMA.2005.359267
  • Filename
    4198526