DocumentCode :
2570565
Title :
Measurement of Spectra of X-Ray Emitted from Neon Plasma
Author :
Zhang, Guixin ; Sing Lee ; Lee, Sing
Author_Institution :
Dept. of EEA, Tsinghua Univ., Beijing
fYear :
2005
fDate :
20-23 June 2005
Firstpage :
237
Lastpage :
237
Abstract :
Summary form only given. In this paper the experimental results of measuring spectra of X-ray emitted from neon plasma will be presented and discussed. Two methods have been employed for this purpose: (1) flat crystal spectrography; (2) filtered 5-channel PIN diode detector. The crystal spectrograph has an adjustment system of five degrees of freedom. It has not only the advantage of easy adjustment, high efficiency and high spectral resolution, but also the capability of providing spatially resolved spectrum in one dimension over 1~50 Aring wavelength range. A TIAP crystal was used, and the spatially resolved X-ray spectra from a neon plasma focus were obtained
Keywords :
neon; plasma X-ray sources; plasma diagnostics; plasma focus; Ne; X-ray spectra; filtered 5-channel PIN diode detector; flat crystal spectrography; neon plasma focus; Detectors; Ignition; Neutrons; Plasma confinement; Plasma measurements; Plasma waves; Plasma x-ray sources; Spatial resolution; X-ray imaging; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
Conference_Location :
Monterey, CA
ISSN :
0730-9244
Print_ISBN :
0-7803-9300-7
Type :
conf
DOI :
10.1109/PLASMA.2005.359302
Filename :
4198561
Link To Document :
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