Title :
A 1ps-Resolution Jitter-Measurement Macro Using Interpolated Jitter Oversampling
Author :
Nose, Koichi ; Kajita, Mikihiro ; Mizuno, Masayuki
Author_Institution :
NEC, Kanagawa
Abstract :
An in-field real-time successive jitter-measurement macro is developed. It features interpolated jitter oversampling and feedforward calibration that help attain 1ps resolution and a hierarchical Vernier jitter-measurement technique that exploits the trade-off between rms and deterministic jitter measurement characteristics
Keywords :
electric noise measurement; jitter; signal sampling; 1 ps; Vernier jitter-measurement; deterministic jitter measurement characteristics; feedforward calibration; interpolated jitter oversampling; jitter-measurement macro; Area measurement; Clocks; Delay lines; Frequency; Jitter; National electric code; Phase measurement; Quantization; Sampling methods; Semiconductor device measurement;
Conference_Titel :
Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0079-1
DOI :
10.1109/ISSCC.2006.1696271
