Title :
1.83ps-Resolution CMOS Dynamic Arbitrary Timing Generator for >4GHz ATE Applications
Author :
Okayasu, T. ; Suda, Martin ; Yamamoto, K. ; Kantake, S. ; Sudou, S. ; Watanabe, D.
Author_Institution :
Advantest, Gunma
Abstract :
A high-speed high-precision dynamic arbitrary timing generator, fabricated in a 0.18mum CMOS process, for >4GHz ATE applications is demonstrated. It exhibits a maximum operating frequency of 1.066 and 4.266GHz (multiplexed mode), a timing resolution of 1.83ps, an INL of <plusmn4ps excluding the calibration RAM, and a random jitter of <0.7psrms
Keywords :
CMOS integrated circuits; automatic test equipment; integrated circuit testing; timing circuits; 0.18 micron; 1.066 GHz; 1.83 ps; 4.266 GHz; CMOS dynamic arbitrary timing generator; CMOS process; automatic test equipment; high-precision dynamic arbitrary timing generator; timing resolution; CMOS technology; Calibration; Clocks; Delay; Feedback circuits; Frequency; Switching circuits; Temperature; Timing jitter; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0079-1
DOI :
10.1109/ISSCC.2006.1696272
