Title :
Microstrip noncontacting thickness monitor
Author :
Hurley, R.B. ; Kaufman, I. ; Roy, R.P.
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona State Univ., Tempe, AZ, USA
Abstract :
A microwave technique for measuring of the height of a thin layer of fluid or a solid coating on a metallic surface using a planar microstrip transmission line structure is presented. A device was designed to monitor the height of a film of water up to about 1 mm. The method produced consistent results and can be adapted for use without microwave frequency measurement devices.<>
Keywords :
microwave measurement; strip lines; thickness measurement; metallic surface; microwave technique; noncontacting thickness monitor; planar microstrip transmission line; thin layer height measurement; Coatings; Frequency measurement; Microstrip; Microwave devices; Microwave frequencies; Microwave measurements; Microwave theory and techniques; Monitoring; Planar transmission lines; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 1989., IEEE MTT-S International
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/MWSYM.1989.38869
