Full-wave analysis of conductor losses on MMIC transmission lines

Author

Heinrich, W.

Author_Institution

Inst. fuer Hochfrequenztech., Darmstadt, West Germany

fYear

1989

fDate

13-15 June 1989

Firstpage

911

Abstract

A mode-matching analysis of lossy planar transmission lines is presented. The metallic layers are treated in the same way as the remaining waveguide subregions, with each of them characterized by its complex dielectric constant. This leads to a fully self-consistent description of the conductor losses that offers two principal advantages compared to the usual perturbation methods: the approach remains valid for metallization dimensions on the order of or even smaller than the skin depth, and non-TEM (transverse electromagnetic) waveguide modes can be analyzed. The validity and usefulness of the extended mode-matching method are demonstrated through a comparison with previous theoretical and experimental work on GaAs MMIC (monolithic microwave integrated circuit) transmission lines. First results on microstrip and slot lines are given.<>

Keywords

MMIC; losses; strip lines; waveguide theory; GaAs; MMIC transmission lines; complex dielectric constant; conductor losses; lossy planar transmission lines; metallic layers; metallization dimensions; microstrip; mode-matching analysis; nonTEM waveguide modes; skin depth; slot lines; Conductors; Dielectric constant; Electromagnetic waveguides; MMICs; Metallization; Perturbation methods; Planar transmission lines; Propagation losses; Transmission line theory; Transmission lines;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1989., IEEE MTT-S International

Conference_Location

Long Beach, CA, USA

Type

conf

DOI

10.1109/MWSYM.1989.38870

Filename

38870