Title :
Starbist Scan Autocorrelated Random Pattern Generation
Author :
Tsai, K.H. ; Hellebrand, S. ; Rajski, J. ; Marek-Sadowska, M.
Author_Institution :
University of California, Santa Barbara
Keywords :
Autocorrelation; Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit testing; Degradation; Hardware; Logic design; Logic testing; Test pattern generators;
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-4093-0
DOI :
10.1109/DAC.1997.597194
