Title :
An on-chip monitor for hot carrier induced degradation
Author :
Li, Xiao-Ming ; Zhuang, Yi-Qi ; Zhao, Jun-Hui ; Wang, Li
Author_Institution :
Xidian Univ., Xian
Abstract :
An on-chip measurement circuit is proposed as a monitor to detect on-line HCD (hot-carrier induced degradation) here, which can be integrated and degraded with the host device, and give an alarm when the device need replacing. This is done prior to actual device failure and able to estimate down time of the system where this device is used, and it only needs a very small area.
Keywords :
condition monitoring; failure analysis; hot carriers; semiconductor device reliability; device failure alarm; hot carrier induced degradation; on-chip measurement circuit; Circuits; Condition monitoring; Degradation; Delay; Equations; Frequency; Hot carriers; Microelectronics; Ring oscillators; Substrates;
Conference_Titel :
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4244-1132-0
Electronic_ISBN :
978-1-4244-1132-0
DOI :
10.1109/ICASIC.2007.4415802
