• DocumentCode
    2571103
  • Title

    A 4GS/s 4b Flash ADC in 0.18/spl mu/m CMOS

  • Author

    Park, Sunghyun ; Palaskas, Yorgos ; Flynn, Michael P.

  • Author_Institution
    Michigan Univ., Ann Arbor, MI
  • fYear
    2006
  • fDate
    6-9 Feb. 2006
  • Firstpage
    2330
  • Lastpage
    2339
  • Abstract
    A 0.18mum CMOS 4GS/s non-interleaved 4b flash ADC is presented. A comparator with a 32times32mum2 on-chip inductor extends sampling rate without extra power consumption. DAC trimming and comparator redundancy reduce DNL and INL to less than 0.15LSB and 0.24LSB, respectively. The measured ENOB is 3.84b and 3.48b at 3GS/s and 4GS/s, respectively. The ADC achieves a BER of less than 10-8
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; comparators (circuits); error statistics; inductors; 0.18 micron; 4 bit; CMOS integrated circuits; DAC trimming; comparator; flash analog-to-digital converter; on-chip inductor; Linearity; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    1-4244-0079-1
  • Type

    conf

  • DOI
    10.1109/ISSCC.2006.1696296
  • Filename
    1696296