DocumentCode :
2571107
Title :
A new soft IP core for online-testing and fault-tolerant structures
Author :
Wei, Wang ; Jianhui, Jiang
Author_Institution :
NXP Semicond. B.V., Shanghai
fYear :
2007
fDate :
22-25 Oct. 2007
Firstpage :
1006
Lastpage :
1009
Abstract :
This paper presents a new soft IP core to construct online-testing and fault-tolerant structures, designs some example structures with commonly-used combinational circuits as CUTs, and analyzes the performance of these CL-ACL examples from an industrial perspective, such as area cost, power consumption, and timing. The results show that CL-ACL can be used to balance the area cost and reliability among all online-testing and fault-tolerant structures, but its power consumption is rather high, the timing of CL-ACL structure is determined by CUT and must be set separately according to different CUTs.
Keywords :
combinational circuits; fault tolerant computing; industrial property; logic testing; CL-ACL structure; CUT; circuits-under-test; combinational circuits; complementary logic-alternating complementary logic; fault-tolerant structures; online-testing; soft IP core; Adders; Circuit faults; Computer industry; Costs; Energy consumption; Fault tolerance; Hardware; Logic testing; Redundancy; Timing; alternating complementary logic; complementary logic; fault tolerance; online test; soft IP core;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4244-1132-0
Electronic_ISBN :
978-1-4244-1132-0
Type :
conf
DOI :
10.1109/ICASIC.2007.4415803
Filename :
4415803
Link To Document :
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