• DocumentCode
    2571107
  • Title

    A new soft IP core for online-testing and fault-tolerant structures

  • Author

    Wei, Wang ; Jianhui, Jiang

  • Author_Institution
    NXP Semicond. B.V., Shanghai
  • fYear
    2007
  • fDate
    22-25 Oct. 2007
  • Firstpage
    1006
  • Lastpage
    1009
  • Abstract
    This paper presents a new soft IP core to construct online-testing and fault-tolerant structures, designs some example structures with commonly-used combinational circuits as CUTs, and analyzes the performance of these CL-ACL examples from an industrial perspective, such as area cost, power consumption, and timing. The results show that CL-ACL can be used to balance the area cost and reliability among all online-testing and fault-tolerant structures, but its power consumption is rather high, the timing of CL-ACL structure is determined by CUT and must be set separately according to different CUTs.
  • Keywords
    combinational circuits; fault tolerant computing; industrial property; logic testing; CL-ACL structure; CUT; circuits-under-test; combinational circuits; complementary logic-alternating complementary logic; fault-tolerant structures; online-testing; soft IP core; Adders; Circuit faults; Computer industry; Costs; Energy consumption; Fault tolerance; Hardware; Logic testing; Redundancy; Timing; alternating complementary logic; complementary logic; fault tolerance; online test; soft IP core;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2007. ASICON '07. 7th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4244-1132-0
  • Electronic_ISBN
    978-1-4244-1132-0
  • Type

    conf

  • DOI
    10.1109/ICASIC.2007.4415803
  • Filename
    4415803