DocumentCode
2571171
Title
Development of simulation platform for the diffraction of periodic structures
Author
Neng, Zhang ; Shuqiang, Chen ; Huajun, Yang ; Shengjian, Lai
Author_Institution
Sch. of Phys. Electron., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2012
fDate
19-21 Oct. 2012
Firstpage
371
Lastpage
374
Abstract
Simulation platform for the diffraction of periodic structures is an important tool in the analysis and measurement of grating structures. In this work, a simulation platform based on Rigorous Coupled Wave Analysis (RCWA) method is developed to simulate diffraction problems of various grating structures. In order to get stable and accurate results, a simpler, more efficient formulation is proposed for cases in which only the reflected amplitudes or the transmitted amplitudes are required. This enhanced implementation of rigorous coupled-wave analysis can be successfully applied to transmission and reflection planar dielectric and absorption holographic gratings, or some more complex grating structures. As a professional simulation platform specially designed for grating structures, it´s capable to calculate the diffraction orders of arbitrarily shaped grating structures illuminated by different polarized wave. Moreover, some other algorithms can be flexibly introduced into this platform to extend its capability as well as applications.
Keywords
holographic gratings; periodic structures; RCWA; absorption holographic gratings; grating structures; periodic structures diffraction; polarized wave; reflected amplitudes; reflection planar dielectric; rigorous coupled wave analysis; simulation platform development; transmitted amplitudes; Algorithm design and analysis; Diffraction; Diffraction gratings; Gratings; Mathematical model; Optimized production technology; RCWA; grating structure; simulation platform;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Problem-Solving (ICCP), 2012 International Conference on
Conference_Location
Leshan
Print_ISBN
978-1-4673-1696-5
Electronic_ISBN
978-1-4673-1695-8
Type
conf
DOI
10.1109/ICCPS.2012.6384245
Filename
6384245
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