DocumentCode
2571255
Title
Design of NOR flash memory cells with high speed programming by utilizing an asymmetric Silicide(TiSi2 ) Drain
Author
Kim, Kyeong-Rok ; Lee, Jung-Woo ; Park, Sang-Su ; Kwack, Kae-Dal
Author_Institution
Hanyang Univ., Seoul
fYear
2007
fDate
22-25 Oct. 2007
Firstpage
1042
Lastpage
1045
Abstract
An unique not-OR (NOR) flash memory cell using an asymmetric Schottky barrier (SB) was designed to increase programming speed and driving current. An asymmetric SB NOR flash memory cell was proposed on the basis of the fundamental structure of the conventional NOR flash memory cells with a length of 90 nm. The programming speed and the driving current of the SB NOR flash memory cell with an asymmetric SB were simulated by using T-SUPREM4 and MEDICI. The simulation results showed that the heavily doped carriers existing in the titanium-disilicide Schottky drain can be used to increase programming speed of the SB NOR flash memory cell and that a decrease in the source/drain series resistance utilizing the silicide in the SB NOR flash memory cell help to increase driving current density.
Keywords
NOR circuits; Schottky barriers; circuit CAD; driver circuits; flash memories; integrated memory circuits; titanium compounds; MEDICI; NOR flash memory cells; T-SUPREM4; TiSi2; asymmetric Schottky barrier; asymmetric titanium silicide drain; driving current; heavily doped carriers; high speed programming; not-OR flash memory cell; size 90 nm; source-drain series resistance; Application software; Current density; Flash memory; Flash memory cells; Immune system; Medical simulation; P-n junctions; Schottky barriers; Silicides; Titanium;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4244-1132-0
Electronic_ISBN
978-1-4244-1132-0
Type
conf
DOI
10.1109/ICASIC.2007.4415811
Filename
4415811
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