• DocumentCode
    2571630
  • Title

    The importance of life cycle modeling to defect detection and prevention

  • Author

    van Moll, J.H. ; Jacobs, J.C. ; Freimut, B. ; Trienekens, J.J.M.

  • Author_Institution
    Philips Semicond., Eindhoven, Netherlands
  • fYear
    2002
  • fDate
    6-8 Oct. 2002
  • Firstpage
    144
  • Lastpage
    155
  • Abstract
    In many low mature organizations dynamic testing is often the only defect detection method applied. Thus, defects are detected rather late in the development process. High rework and testing effort, typically under time pressure, lead to unpredictable delivery dates and uncertain product quality. This paper presents several methods for early defect detection and prevention that have been in existence for quite some time, although not all of them are common practice. However, to use these methods operationally and scale them to a particular project or environment, they have to be positioned appropriately in the life cycle, especially in complex projects. Modeling the development life cycle, that is the construction of a project-specific life cycle, is an indispensable first step to recognize possible defect injection points throughout the development project and to optimize the application of the available methods for defect detection and prevention. This paper discusses the importance of life cycle modeling for defect detection and prevention and presents a set of concrete, proven methods that can be used to optimize defect detection and prevention. In particular, software inspections, static code analysis, defect measurement and defect causal analysis are discussed. These methods allow early, low cost detection of defects, preventing them from propagating to later development stages and preventing the occurrence of similar defects in future projects.
  • Keywords
    program diagnostics; program testing; project management; software development management; software performance evaluation; software quality; software reliability; complex project; defect causal analysis; defect detection; defect injection point; defect measurement; defect prevention; development life cycle; development process; development project; life cycle modeling; low cost detection; optimization; organization dynamic testing; product quality; project-specific life cycle; quality demand; software inspections; static code analysis; Application software; Concrete; Consumer electronics; Costs; Inspection; Jacobian matrices; Optimization methods; Particle measurements; Software measurement; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Technology and Engineering Practice, 2002. STEP 2002. Proceedings. 10th International Workshop on
  • Print_ISBN
    0-7695-1878-8
  • Type

    conf

  • DOI
    10.1109/STEP.2002.1267624
  • Filename
    1267624