• DocumentCode
    257170
  • Title

    Block reinforcement to optimize lifetime of flash storage devices

  • Author

    Chien-Chung Ho ; Yuan-Hao Chang ; Che-Wei Tsao ; Pei-Lun Suei

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2014
  • fDate
    7-10 Oct. 2014
  • Firstpage
    717
  • Lastpage
    718
  • Abstract
    With the advances of manufacturing technology and aggressive use of multi-level-cell (MLC) for flash memory, flash memory has faced a serious challenge on its device lifetime due to the fast-decreasing capacity caused by worn-out blocks. In contrast to existing works, we propose a block reinforcement scheme to optimize the guaranteed lifetime of flash storage devices by extending the useable period of flash blocks with limited performance degradation and space overhead. A serious of experiments was conducted to evaluate the efficacy of the proposed scheme and the results are very encouraging.
  • Keywords
    flash memories; multivalued logic circuits; MLC; block reinforcement scheme; flash storage device lifetime optimization; multilevel-cell; performance degradation; worn-out blocks; Ash; Bit error rate; Error correction codes; Flash memories; Parity check codes; Performance evaluation; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics (GCCE), 2014 IEEE 3rd Global Conference on
  • Conference_Location
    Tokyo
  • Type

    conf

  • DOI
    10.1109/GCCE.2014.7031339
  • Filename
    7031339