DocumentCode
2571739
Title
Sequential equivalence techniques for high performance design
Author
Balakrishnan, Sini
Author_Institution
Senior Design Eng. Infineon Technol., Bangalore
fYear
2007
fDate
22-25 Oct. 2007
Firstpage
1162
Lastpage
1165
Abstract
Quite often in semiconductor industry, when a product is nearing its launch date, most of us have had the deja-vu situation of performance to time-to-market trade-offs; especially in high-performance designs. Sequential equivalence checking opens up possibilities in this area, by enabling performance-tuning related sequential micro-architectural changes to be verified with significantly lower impact on effort estimates and risk. This nascent technology promises to change the way we look at eleventh hour changes.
Keywords
logic design; logic testing; RTL; high performance design; performance-tuning; semiconductor industry; sequential equivalence techniques; sequential microarchitectural changes; time-to-market trade-offs; Buildings; Computer bugs; Design engineering; Design methodology; Electronics industry; Sequential analysis; Testing; Time to market; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4244-1132-0
Electronic_ISBN
978-1-4244-1132-0
Type
conf
DOI
10.1109/ICASIC.2007.4415840
Filename
4415840
Link To Document