• DocumentCode
    2571739
  • Title

    Sequential equivalence techniques for high performance design

  • Author

    Balakrishnan, Sini

  • Author_Institution
    Senior Design Eng. Infineon Technol., Bangalore
  • fYear
    2007
  • fDate
    22-25 Oct. 2007
  • Firstpage
    1162
  • Lastpage
    1165
  • Abstract
    Quite often in semiconductor industry, when a product is nearing its launch date, most of us have had the deja-vu situation of performance to time-to-market trade-offs; especially in high-performance designs. Sequential equivalence checking opens up possibilities in this area, by enabling performance-tuning related sequential micro-architectural changes to be verified with significantly lower impact on effort estimates and risk. This nascent technology promises to change the way we look at eleventh hour changes.
  • Keywords
    logic design; logic testing; RTL; high performance design; performance-tuning; semiconductor industry; sequential equivalence techniques; sequential microarchitectural changes; time-to-market trade-offs; Buildings; Computer bugs; Design engineering; Design methodology; Electronics industry; Sequential analysis; Testing; Time to market; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2007. ASICON '07. 7th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4244-1132-0
  • Electronic_ISBN
    978-1-4244-1132-0
  • Type

    conf

  • DOI
    10.1109/ICASIC.2007.4415840
  • Filename
    4415840