• DocumentCode
    2572028
  • Title

    Depletion-mode GaAs MOSFETs with negligible drain current drift and hysteresis

  • Author

    Wang, Y.C. ; Hong, M. ; Kuo, J.M. ; Mannaerts, J.P. ; Kwo, J. ; Tsai, H.S. ; Krajewski, J.J. ; Chen, Y.K. ; Cho, A.Y.

  • Author_Institution
    Bell Lab., Lucent Technol., Murray Hill, NJ, USA
  • fYear
    1998
  • fDate
    6-9 Dec. 1998
  • Firstpage
    67
  • Lastpage
    70
  • Abstract
    For the first time, depletion-mode GaAs MOSFETs with undetectable hysteresis and negligible drain current drift I-V characteristics were successfully fabricated using MBE grown Ga/sub 2/O/sub 3/(Gd/sub 2/O/sub 3/) as the gate oxide. The absence of drain current drift and hysteresis is a significant advance towards the manufacture of commercially useful GaAs MOSFETs.
  • Keywords
    III-V semiconductors; MOSFET; gallium arsenide; GaAs-Ga/sub 2/O/sub 3/:Gd/sub 2/O/sub 3/; I-V characteristics; MBE Ga/sub 2/O/sub 3/(Gd/sub 2/O/sub 3/) gate oxide; depletion-mode GaAs MOSFET; drain current drift; hysteresis; FET integrated circuits; Gallium arsenide; Hysteresis; MMICs; MOSFETs; Microwave FET integrated circuits; Microwave integrated circuits; Molecular beam epitaxial growth; Substrates; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-4774-9
  • Type

    conf

  • DOI
    10.1109/IEDM.1998.746248
  • Filename
    746248