Title :
LPCVD polysilicon films with controlled curvature for optical MEMS: the MultiPolyTM process
Author_Institution :
Dept. of Mater. Sci. & Eng., Case Western Reserve Univ., Cleveland, OH, USA
Abstract :
A new technique is presented for producing polysilicon films with predetermined stress profiles. Polysilicon films deposited by LPCVD exhibit tensile or compressive residual stresses, depending on the deposition temperature. Polysilicon films comprised of alternating tensile and compressive layers can display any overall value of stress and stress gradient. We call the multilayer material MultiPolyTM and the process the MultiPolyTM process. Structures made from these films can be designed to display deliberate curvatures as-fabricated resulting in novel optical devices, such as focusing mirrors. Electrostatic actuation can be used to modify the shapes of these polysilicon structures, creating optical switches
Keywords :
CVD coatings; chemical vapour deposition; elemental semiconductors; internal stresses; micro-optics; mirrors; optical multilayers; optical switches; semiconductor growth; semiconductor thin films; silicon; LPCVD polysilicon films; MultiPoly process; Si; alternating tensile/compressive layers; compressive residual stresses; controlled curvature; deposition temperature dependence; electrostatic actuation; focusing mirrors; multilayer material; optical MEMS; optical switches; predetermined stress profiles; tensile residual stresses; Compressive stress; Displays; Micromechanical devices; Nonhomogeneous media; Optical control; Optical films; Optical materials; Residual stresses; Temperature dependence; Tensile stress;
Conference_Titel :
Optical MEMS, 2000 IEEE/LEOS International Conference on
Conference_Location :
Kauai, HI
Print_ISBN :
0-7803-6257-8
DOI :
10.1109/OMEMS.2000.879654