DocumentCode
2572118
Title
The research and implement of an advanced function coverage based verification environment
Author
Yang, Runshan ; Wu, Liji ; Guo, Jun ; Liu, Baorong
Author_Institution
Tsinghua Univ., Beijing
fYear
2007
fDate
22-25 Oct. 2007
Firstpage
1253
Lastpage
1256
Abstract
This paper developed an advanced function coverage-directed reusable ASIC verification environment with automatic verification vectors generation. A layered architecture is adopted for reusing; the verification vectors are randomly generated and the simulation results can be checked automatically. Further more, genetic algorithm is employed to improve the efficiency of the verification vectors generation. The result of experiments performed on a smart card showed this method to be effective and efficient.
Keywords
application specific integrated circuits; genetic algorithms; advanced function coverage; automatic verification vectors generation; genetic algorithm; layered architecture; Application specific integrated circuits; Biological cells; Debugging; Genetic algorithms; Large-scale systems; Microelectronics; Silicon; Smart cards; System testing; Writing; function coverage; genetic algorithm; reusability; verification; verification vectors automatic generation;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4244-1132-0
Electronic_ISBN
978-1-4244-1132-0
Type
conf
DOI
10.1109/ICASIC.2007.4415863
Filename
4415863
Link To Document