• DocumentCode
    2572118
  • Title

    The research and implement of an advanced function coverage based verification environment

  • Author

    Yang, Runshan ; Wu, Liji ; Guo, Jun ; Liu, Baorong

  • Author_Institution
    Tsinghua Univ., Beijing
  • fYear
    2007
  • fDate
    22-25 Oct. 2007
  • Firstpage
    1253
  • Lastpage
    1256
  • Abstract
    This paper developed an advanced function coverage-directed reusable ASIC verification environment with automatic verification vectors generation. A layered architecture is adopted for reusing; the verification vectors are randomly generated and the simulation results can be checked automatically. Further more, genetic algorithm is employed to improve the efficiency of the verification vectors generation. The result of experiments performed on a smart card showed this method to be effective and efficient.
  • Keywords
    application specific integrated circuits; genetic algorithms; advanced function coverage; automatic verification vectors generation; genetic algorithm; layered architecture; Application specific integrated circuits; Biological cells; Debugging; Genetic algorithms; Large-scale systems; Microelectronics; Silicon; Smart cards; System testing; Writing; function coverage; genetic algorithm; reusability; verification; verification vectors automatic generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2007. ASICON '07. 7th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4244-1132-0
  • Electronic_ISBN
    978-1-4244-1132-0
  • Type

    conf

  • DOI
    10.1109/ICASIC.2007.4415863
  • Filename
    4415863