DocumentCode
2572536
Title
Maximum entropy mobility spectrum analysis for magnetotransport characterization of semiconductor multilayer structures
Author
Myronov, M. ; Kiatgamolchai, S. ; Mironov, O.A. ; Kantser, V.G. ; Parker, E.H.C. ; Whall, T.E.
Author_Institution
Dept. of Phys., Warwick Univ., Coventry, UK
Volume
2
fYear
2002
fDate
2002
Firstpage
415
Abstract
The maximum entropy mobility spectrum analysis (ME-MSA) method has been developed on the basis of a maximum entropy (ME) principle. It allows one to calculate a smooth electrical conductivity versus mobility plot ("mobility spectrum") from the classical magnetoconductivity tensor in semiconductor multilayer structures. The advantages of the ME-MSA as compared to the MSA are demonstrated using a synthetic data set.
Keywords
carrier mobility; electrical conductivity; magnetoresistance; maximum entropy methods; semiconductor superlattices; tensors; ME-MSA method; classical magnetoconductivity tensor; magnetotransport; maximum entropy mobility spectrum analysis; mobility spectrum; semiconductor multilayer structures; smooth electrical conductivity versus mobility plot; Charge carrier processes; Conductivity; Entropy; Laboratories; Magnetic analysis; Magnetic fields; Magnetic multilayers; Magnetic semiconductors; Physics; Tensile stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2002. CAS 2002 Proceedings. International
Print_ISBN
0-7803-7440-1
Type
conf
DOI
10.1109/SMICND.2002.1105881
Filename
1105881
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