DocumentCode
25726
Title
Multilayer Silicon Nitride-on-Silicon Integrated Photonic Platforms and Devices
Author
Sacher, Wesley D. ; Ying Huang ; Guo-Qiang Lo ; Poon, Joyce K. S.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
Volume
33
Issue
4
fYear
2015
fDate
Feb.15, 15 2015
Firstpage
901
Lastpage
910
Abstract
We review and present additional results from our work on multilayer silicon nitride (SiN) on silicon-on-insulator (SOI) integrated photonic platforms over the telecommunication wavelength bands near 1550 and 1310 nm. SiN-on-SOI platforms open the possibility for passive optical functionalities implemented in the SiN layer to be combined with active functionalities in the SOI. SiN layers can be integrated onto SOI using a front-end or back-end of line integration process flow. These photonic platforms support low-loss SiN waveguides, low-loss and low-crosstalk waveguide crossings, and low-loss interlayer transitions using adiabatic tapers. Novel ultra-broadband and efficient grating couplers as well as polarization management devices are enabled by the close coupling between the silicon and SiN layers.
Keywords
diffraction gratings; elemental semiconductors; integrated optics; optical couplers; optical losses; optical waveguides; silicon; silicon compounds; silicon-on-insulator; SiN-Si; SiN-on-SOI platforms; adiabatic tapers; line integration process flow; low-crosstalk waveguide crossings; low-loss interlayer transitions; low-loss waveguide crossings; multilayer silicon nitride-on-silicon integrated photonic platforms; polarization management devices; silicon-on-insulator integrated photonic platforms; telecommunication wavelength bands; ultra-broadband grating couplers; Loss measurement; Optical device fabrication; Optical losses; Optical waveguides; Silicon; Silicon compounds; Waveguide transitions; Bragg gratings; Silicon photonics; integrated optics; polarization; silicon photonics; waveguides;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2015.2392784
Filename
7014292
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