Title :
A rapid configurable embedded development framework
Author :
Goh, Kiah Mok ; Tjahjono, Benny ; Aendenroomer, Anton J R
Author_Institution :
Singapore Inst. of Manuf. Technol., Singapore
Abstract :
Early detection of system failure required continuous monitoring of electro-mechanical system which required embedded prognostics devices. Unfortunately, the current research and industrial solutions do not provide a user friendly and rapidly configurable environment to create ´adaptive microprocessor size with supercomputer performance´ embedded solution in order to reduce downtime. Developing a solution for various industrial domains can be too time-consuming because the tools and rapid methods for creating embedded reconfigurable solutions are lacking. In this paper, we present a proof of concept of a rapid configurable embedded development environment using IEC 61499 Functional Blocks. Two test cases, which include an XOR Gate for Field Programmable Gate Array (FPGA) and a PID tank level controller for an ARM based Linux embedded system are used in the paper to discuss the potential of the framework. Finally, a research agenda towards a distributed cluster head/sensor nodes distributed prognostics concept is identified.
Keywords :
Linux; distributed sensors; embedded systems; field programmable gate arrays; industrial control; logic gates; system monitoring; three-term control; ARM; IEC 61499 functional block; Linux embedded system; PID tank level controller; XOR gate; adaptive microprocessor; continuous monitoring; distributed cluster head node; distributed sensor node; electro-mechanical system; embedded prognostic device; field programmable gate array; rapid configurable embedded development; supercomputer performance; system failure detection; user friendly; Condition monitoring; Control systems; Embedded system; Field programmable gate arrays; IEC standards; Linux; Microprocessors; Supercomputers; System testing; Three-term control; Distributed control systems; Embedded System; FPGA; Function Block; IEC 61499; Rapid application development;
Conference_Titel :
Emerging Technologies and Factory Automation, 2007. ETFA. IEEE Conference on
Conference_Location :
Patras
Print_ISBN :
978-1-4244-0825-2
Electronic_ISBN :
978-1-4244-0826-9
DOI :
10.1109/EFTA.2007.4416763