• DocumentCode
    2572955
  • Title

    A rapid configurable embedded development framework

  • Author

    Goh, Kiah Mok ; Tjahjono, Benny ; Aendenroomer, Anton J R

  • Author_Institution
    Singapore Inst. of Manuf. Technol., Singapore
  • fYear
    2007
  • fDate
    25-28 Sept. 2007
  • Firstpage
    135
  • Lastpage
    140
  • Abstract
    Early detection of system failure required continuous monitoring of electro-mechanical system which required embedded prognostics devices. Unfortunately, the current research and industrial solutions do not provide a user friendly and rapidly configurable environment to create ´adaptive microprocessor size with supercomputer performance´ embedded solution in order to reduce downtime. Developing a solution for various industrial domains can be too time-consuming because the tools and rapid methods for creating embedded reconfigurable solutions are lacking. In this paper, we present a proof of concept of a rapid configurable embedded development environment using IEC 61499 Functional Blocks. Two test cases, which include an XOR Gate for Field Programmable Gate Array (FPGA) and a PID tank level controller for an ARM based Linux embedded system are used in the paper to discuss the potential of the framework. Finally, a research agenda towards a distributed cluster head/sensor nodes distributed prognostics concept is identified.
  • Keywords
    Linux; distributed sensors; embedded systems; field programmable gate arrays; industrial control; logic gates; system monitoring; three-term control; ARM; IEC 61499 functional block; Linux embedded system; PID tank level controller; XOR gate; adaptive microprocessor; continuous monitoring; distributed cluster head node; distributed sensor node; electro-mechanical system; embedded prognostic device; field programmable gate array; rapid configurable embedded development; supercomputer performance; system failure detection; user friendly; Condition monitoring; Control systems; Embedded system; Field programmable gate arrays; IEC standards; Linux; Microprocessors; Supercomputers; System testing; Three-term control; Distributed control systems; Embedded System; FPGA; Function Block; IEC 61499; Rapid application development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Technologies and Factory Automation, 2007. ETFA. IEEE Conference on
  • Conference_Location
    Patras
  • Print_ISBN
    978-1-4244-0825-2
  • Electronic_ISBN
    978-1-4244-0826-9
  • Type

    conf

  • DOI
    10.1109/EFTA.2007.4416763
  • Filename
    4416763