• DocumentCode
    2573271
  • Title

    Microstructure comparative analysis of the solder joints based on SAC/SN100 soldering alloy type depending on the cooling rate

  • Author

    Plotog, I. ; Dumitru, G. ; Codreanu, N.D. ; Vasile, A. ; Branzei, M. ; Pencea, I. ; Tarcolea, M.

  • Author_Institution
    Dept. Center of Technol. Electron. & Interconnection Tech.-CETTI, Politeh. Univ. of Bucharest, Bucharest, Romania
  • fYear
    2012
  • fDate
    25-28 Oct. 2012
  • Firstpage
    167
  • Lastpage
    172
  • Abstract
    Microstructural analysis in the section of solder joints show a multilayer structure composed of IMC layers caused by the interface phenomena specific to soldering processes and a typical volume, unaffected by these phenomena, but depending of soldering process thermal profile, especially by the cooling zone parameters. In the paper were theoretically studied and experimentally evidenced genesis of the multilayer structure depending on the type of alloy and the specific cooling rate of the soldering process. Experiments were designed in order to obtain similar volumes of solder joints unaffected by the interface phenomena, taking into consideration Vapour Phase Soldering (VPS) processes characterized by different cooling rates and 6 types of Lead-Free solder pastes. The results highlight the microstructural differences in the unaffected by dissolution and diffusion volume of solder joints, between and for each type of solder pastes depending on the cooling rate. Based on these practical results could be improved the thermal profile of the soldering processes in VPS technology in order to increase the solder joints reliability.
  • Keywords
    cooling; copper alloys; crystal microstructure; diffusion; dissolving; reliability; silver alloys; soldering; tin alloys; IMC layers; SAC-SN100 soldering alloy; SnAgCu; VPS process; VPS technology; cooling rate; cooling zone parameters; diffusion volume; dissolution; interface phenomena; lead-free solder pastes; microstructure comparative analysis; multilayer structure; solder joint reliability; solder joints; soldering process thermal profile; vapour phase soldering process; Compounds; Cooling; Intermetallic; Microstructure; Nonhomogeneous media; Soldering; IMC; SAC; SN100; Solder joints microstructure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology in Electronic Packaging (SIITME), 2012 IEEE 18th International Symposium for
  • Conference_Location
    Alba Iulia
  • Print_ISBN
    978-1-4673-4760-0
  • Electronic_ISBN
    INAVLID ISBN
  • Type

    conf

  • DOI
    10.1109/SIITME.2012.6384369
  • Filename
    6384369