DocumentCode :
2574126
Title :
Depth-variant image restoration in 3D fluorescence microscopy: Two approaches under Gaussian and Poissonian noise conditions
Author :
Ben Hadj, S. ; Blanc-Féraud, L. ; Maalouf, E. ; Colicchio, B. ; Dieterlen, A.
Author_Institution :
Morpheme Res. Group, UNSA, Sophia Antipolis, France
fYear :
2012
fDate :
2-5 May 2012
Firstpage :
1671
Lastpage :
1674
Abstract :
In this article, we are interested in restoring images from 3D fluorescence microscopy. In fact, these images are affected by a depth-variant blur due to light refraction phenomenon. We present and compare two different restoration strategies for that problem. The first one is based on multiple deconvolutions with depth-invariant blur functions and the second one consists in using a depth-variant blur function in the deconvolution process. Furthermore, we fit two deconvolution algorithms to this problem. First, we use the Richardson-Lucy method with total variation regularization to restore confocal microscopy images which are affected by a Poisson noise. Then, we focus on restoring wide field microscopy images which are corrupted by a Gaussian noise. Tests on simulated data show that the second restoration strategy is slightly more accurate than the first one for both noise conditions.
Keywords :
Gaussian noise; biomedical optical imaging; deconvolution; fluorescence; image restoration; medical image processing; optical microscopy; 3D fluorescence microscopy; Gaussian noise condition; Poisson noise condition; Richardson-Lucy method; confocal microscopy images; depth invariant blur function; depth variant blur function; depth variant image restoration; light refraction phenomenon; multiple deconvolution; total variation regularization; wide field microscopy images; Deconvolution; Gaussian noise; Image restoration; Microscopy; Optical microscopy; Silicon; Depth-variant blur; PSF; energy minimization; fluorescence microscopy; noise; restoration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging (ISBI), 2012 9th IEEE International Symposium on
Conference_Location :
Barcelona
ISSN :
1945-7928
Print_ISBN :
978-1-4577-1857-1
Type :
conf
DOI :
10.1109/ISBI.2012.6235899
Filename :
6235899
Link To Document :
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