Title :
Fault Simulation Under The Multiple Observation Time Approach Using Backward Implications
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
University of Iowa Iowa City, IA 52242
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Electrical fault detection; Fault detection; Fault diagnosis; Permission; Sequential circuits;
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-4093-0
DOI :
10.1109/DAC.1997.597218
