DocumentCode
2574649
Title
Fault Simulation Under The Multiple Observation Time Approach Using Backward Implications
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
University of Iowa Iowa City, IA 52242
fYear
1997
fDate
9-13 June 1997
Firstpage
608
Lastpage
613
Keywords
Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Electrical fault detection; Fault detection; Fault diagnosis; Permission; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location
Anaheim, CA, USA
ISSN
0738-100X
Print_ISBN
0-7803-4093-0
Type
conf
DOI
10.1109/DAC.1997.597218
Filename
597218
Link To Document