DocumentCode :
2574807
Title :
Atpg For Heat Dissipation Minimization During Scan Testing
Author :
Wang, Seongmoon ; Gupta, Sandeep K.
Author_Institution :
University of Southern California
fYear :
1997
fDate :
9-13 June 1997
Firstpage :
614
Lastpage :
619
Keywords :
Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Minimization; Nondestructive testing; Permission; Sequential analysis; Sequential circuits; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
ISSN :
0738-100X
Print_ISBN :
0-7803-4093-0
Type :
conf
DOI :
10.1109/DAC.1997.597219
Filename :
597219
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2574807
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