Title :
On the use of parametric and non-parametric noise-models in time- and frequency domain system identification
Author :
Schoukens, J. ; Rolain, Y. ; Pintelon, R.
Author_Institution :
Dept. ELEC, Vrije Univ. Brussel, Brussels, Belgium
Abstract :
In this paper we start from the observation that there is an exact equivalence between time- and frequency domain identification for finite length data records under the standard conditions of the prediction error framework. Next we study the identification of a nonparametric plant and noise model, in the time- and frequency domain. Finally we discuss the mixed use of parametric plant models and nonparametric noise models in the identification process, and comment its impact on the user choices. It turns out that the availability of a nonparametric noise model simplifies significantly the identification of a parametric plant model. All these results are valid for random, arbitrary, and periodic excitations.
Keywords :
frequency-domain analysis; identification; time-domain analysis; frequency-domain system identification; noise model; nonparametric noise-model; parametric plant model; prediction error; time-domain system identification; Artificial neural networks; Time- and frequency-domain system identifcation; frequency domain; leakage; non-parametric; parametric; parametric and non-parametric models; system identification; time domain; transients;
Conference_Titel :
Decision and Control (CDC), 2010 49th IEEE Conference on
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-7745-6
DOI :
10.1109/CDC.2010.5717606