• DocumentCode
    2575450
  • Title

    The Effect of Contact Angle and Solder Bump Arrangement on Underfill Process

  • Author

    Young, Wen-Bin

  • Author_Institution
    Dept. of Aeronaut. & Astronaut., National Cheng-Kung Univ., Tainan
  • fYear
    2006
  • fDate
    26-29 Aug. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This study was devoted to investigate the effects of the contact angle and the bump arrangement on the underfill flow. The Hele-Shaw flow model, that considered the flow resistance in both the thickness direction between the chip and substrate and the plane direction between solder bumps, was assumed. A modified capillary force model including the effects of the contact angle and the bump arrangement was proposed. The capillary force was formulated based on either quadrilateral or hexagonal bump arrangements. A hexagonal arrangement of solder bumps was studied
  • Keywords
    contact angle; filling; solders; Hele-Shaw flow model; contact angle; flow resistance; hexagonal arrangement; modified capillary force model; solder bump arrangement; underfill flow; underfill process; Contacts; Ducts; Electronic packaging thermal management; Equations; Filling; Joining materials; Permeability; Soldering; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0619-6
  • Electronic_ISBN
    1-4244-0620-X
  • Type

    conf

  • DOI
    10.1109/ICEPT.2006.359734
  • Filename
    4198855