Title :
Overall outage probability of two-way amplify-and-forward relaying in Nakagami-m fading channels
Author :
Xu, Xiaoming ; Cai, Yueming ; Cai, Chunxiao ; Yang, Wendong
Author_Institution :
Inst. of Commun. Eng., PLA Univ. of Sci. & Technol., Nanjing, China
Abstract :
Analytic ally studying the overall outage performance of two-way amplify-and-forward (AF) relaying systems has always been a difficult task. In this paper we study the overall outage probability (OOP) for the two-way amplify-and-forward (AF) relaying system. The channels are independent but not identically Nakagami-m fading distributed. We obtain the tight closed-form OOP approximated expression for the system. Our results indicate that the tight closed-form approximation can march the simulation perfectly in large signal-to-noise ratios (SNRs). The theoretical analysis can be further applied to study the two-way multiple-relay systems in Nakagami-m fading channels.
Keywords :
amplify and forward communication; approximation theory; fading channels; probability; Nakagami-m fading channel; closed-form OOP approximated expression; overall outage probability; signal-to-noise ratio; two-way amplify-and-forward relaying; two-way multiple-relay system; Approximation methods; Bidirectional control; Rayleigh channels; Relays; Signal to noise ratio; Simulation; Overall outage probability; amplify-and-forward; two-way relaying;
Conference_Titel :
Wireless Communications and Signal Processing (WCSP), 2011 International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4577-1009-4
Electronic_ISBN :
978-1-4577-1008-7
DOI :
10.1109/WCSP.2011.6096817
