Title :
A novel high-gain CMOS image sensor using floating N-well/gate tied PMOSFET
Author :
Weiquan Zhang ; Mansun Chan ; Ko, P.K.
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, Hong Kong
Abstract :
The development of low power CMOS imaging systems has received a lot of attention. The main obstacle comes from the low responsivity and unscalability of the photo sensor. In this work, we have designed and fabricated a highly responsive photo sensor from a standard MOSIS HP0.8 /spl mu/m n-well CMOS process. The photo sensor is obtained by connecting the n-well with the n/sup +/ polysilicon gate of a PMOSFET. From the experimental results, the output photo current from a 8.2 /spl mu/m/0.8 /spl mu/m device is of the order of ten /spl mu/A. The self-amplification, which gives the high responsivity can be further increased by technology scaling. A simple 32/spl times/32 sensor array chip has also been fabricated to demonstrate the feasibility for using the new device in a CMOS imaging circuit.
Keywords :
CMOS image sensors; integrated circuit technology; low-power electronics; 0.8 micron; 10 muA; floating N-well/gate tied PMOSFET; high-gain CMOS image sensor; highly responsive photo sensor; low power CMOS imaging systems; n/sup +/ polysilicon gate; self-amplification; sensor array chip; standard MOSIS n-well CMOS process; technology scaling; CMOS image sensors; CMOS process; CMOS technology; Current measurement; Lighting; MOSFET circuits; Optical feedback; Optical imaging; Sensor arrays; Voltage;
Conference_Titel :
Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-4774-9
DOI :
10.1109/IEDM.1998.746528