DocumentCode :
2576087
Title :
Temperature variation effect on dynamic characteristics of GaAs avalanche photodiodes
Author :
Ahmadi, V. ; Masudy-Panah, S.
Author_Institution :
Dept. of Electr. Eng., Tarbiat Modares Univ., Tehran
Volume :
2
fYear :
2008
fDate :
22-26 June 2008
Firstpage :
178
Lastpage :
181
Abstract :
In this paper, for the first time, we investigate the effects of temperature variation on the dynamic characteristics of homojunction GaAs avalanche photodiodes (APDs) over a temperature range of 77 K to 300 K. It is shown that we have higher breakdown voltage and lower frequency bandwidth as the operating temperature increases. We also show that the effect of temperature variation on breakdown voltage reduces in very short multiplication region APDs. In other word for the thin APDs, unlike the thick APDs, the effect of temperature variation on breakdown voltage is negligible.
Keywords :
III-V semiconductors; avalanche photodiodes; gallium arsenide; semiconductor device models; semiconductor junctions; APD; DSMT; GaAs; breakdown voltage; dead-space-multiplication theory; dynamic property; frequency bandwidth; homojunction avalanche photodiode; temperature 77 K to 300 K; Avalanche photodiodes; Bandwidth; Charge carrier processes; Electrons; Gallium arsenide; Ionization; Phonons; Scattering; Semiconductor device noise; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transparent Optical Networks, 2008. ICTON 2008. 10th Anniversary International Conference on
Conference_Location :
Athens
Print_ISBN :
978-1-4244-2625-6
Electronic_ISBN :
978-1-4244-2626-3
Type :
conf
DOI :
10.1109/ICTON.2008.4598625
Filename :
4598625
Link To Document :
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