• DocumentCode
    2576318
  • Title

    Medical Device Wafer Singulation

  • Author

    Teng, Annette ; Wilhelmsen, Finn

  • Author_Institution
    CORWIL Technol., Milpitas, CA
  • fYear
    2007
  • fDate
    3-5 Oct. 2007
  • Firstpage
    108
  • Lastpage
    113
  • Abstract
    Singulation can be the most damaging step in electronic manufacturing where individual dice are freed from a brittle silicon wafer. So much torque and force is applied to the silicon during this process that if precautionary steps are not taken, the freed die may exhibit low strength due to chipping damage. For medical devices, this is particularly a problem because medical devices must be specially shaped and assembled so that they can fit into small implantable or insertable units for the human body. Insertable medical products require that dice have unusually high aspect ratios in order to fit into tubular shaped instruments. For this paper, we have emulated a medical device using blank silicon wafers cut to >3.60 mm long 0.36 mm wide and 0.100 mm thick. The aspect ratios of 10:1 will be compared with lower as well as high aspect ratios for dicing quality and die integrity. With standard dicing parameters with standard blades, the singulation yield would be as low as zero. Even the use of step cut which in most cases would alleviate chipping, but for such high aspect ratio dice, the yield improved to only 50%. This paper will present comparative yield results of various dicing setups to find the process with the best yield on singulated dice. 100% yield for singulation resulting in higher strength devices can be obtained using properly selected blades with the correct dicing parameters. Newer, stronger and narrower blades are allowing dice with high aspect ratios to be sawn without chipping yield loss. Also special dicing programs are required to produce chip-free dies without resorting to laser saws.
  • Keywords
    biomedical electronics; biomedical equipment; blades; elemental semiconductors; semiconductor device manufacture; silicon; brittle silicon wafer; chipping damage; chipping yield loss; dicing quality; die integrity; electronic manufacturing; implantable units; insertable units; medical device wafer singulation; medical products; size 0.100 mm; size 0.36 mm; tubular shaped instruments; Assembly; Blades; Costs; Humans; Instruments; Manufacturing; Sawing machines; Silicon; Tiles; Torque;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 2007. IEMT '07. 32nd IEEE/CPMT International
  • Conference_Location
    San Jose, CA
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-1335-5
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2007.4417062
  • Filename
    4417062