• DocumentCode
    2576625
  • Title

    Silicon Wafer Backside Thinning with Mechanical and Chemical Method for Better Mechanical Property

  • Author

    Jiang, Asen Long Xin ; Ming, Lai Chih ; Gao, Jeff Chen Yi ; Hwee, Tan Kim

  • Author_Institution
    Jiangyin Changdian Adv. Packaging Pte Ltd.
  • fYear
    2006
  • fDate
    26-29 Aug. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A cheaper alternative method of silicon wafer backside grinding and thinning, including the mechanical rough backside grinding and chemical polish was studied and conducted in JCAP (Jiangyin Changdian Advanced Package Co., LTD.) to respond to the trend of thinner chip for semi-conduct package. This study mainly focused on using different etchant to etch Silicon to release the stress caused by the mechanical grinding, in addition micro-crack from the mechanical back-grinding can be eliminated, the stress can increase the operational difficulty of thin wafer in the semiconductor assembly packaging process, such as SRD (Spin Rinse Dryer), transfer and handle. HNA(hydrofluoric and nitric diluted by acetic) was chosen as the etchant for silicon etching, because it is perfect and economical. For different application, there are different etch depths. After silicon etching, the wafer was cleaned with physical or chemical way, depending on the product property and function. Using this way, JCAP can achieve thinner than 100 mum in 6 inches wafer and can be back metallized
  • Keywords
    elemental semiconductors; grinding; integrated circuit manufacture; microcracks; silicon; wafer level packaging; 100 micron; 6 inches; backside thinning; chemical method; mechanical grinding; mechanical property; micro crack; silicon wafer; stress; Chemicals; Mechanical factors; Plasma applications; Plasma chemistry; Rough surfaces; Semiconductor device packaging; Silicon; Stress; Surface roughness; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0619-6
  • Electronic_ISBN
    1-4244-0620-X
  • Type

    conf

  • DOI
    10.1109/ICEPT.2006.359813
  • Filename
    4198934