Title :
Simulation of X-ray diffraction patterns using a massively parallel SIMD platform
Author :
Rosato, Vittorio ; Pucello, Nicoletta ; Cardellini, Francesco
Author_Institution :
ENEA, Rome, Italy
Abstract :
A code for the simulation of X-ray diffraction pattern of a powder has been implemented on a massively parallel SIMD platform developed in the frame of the PQE2000 Project. The code allows the evaluation of the diffraction pattern of atomic-scale models of both perfectly ordered and disordered structures. The code has been used to investigate the structures resulting from the non-equilibrium alloying process of an immiscible metallic couple (Ag-Cu)
Keywords :
X-ray diffraction; digital simulation; parallel processing; physics computing; powders; PQE2000 Project; X-ray diffraction patterns; atomic-scale models; massively parallel SIMD; Alloying; Atomic layer deposition; Chemicals; Crystallization; Internal stresses; Lattices; Materials science and technology; Powders; X-ray diffraction; X-ray scattering;
Conference_Titel :
Parallel and Distributed Processing, 1999. PDP '99. Proceedings of the Seventh Euromicro Workshop on
Conference_Location :
Funchal
Print_ISBN :
0-7695-0059-5
DOI :
10.1109/EMPDP.1999.746694
