• DocumentCode
    2576955
  • Title

    The Optimization of Reflow Soldering Temperature Profile Based on Simulation

  • Author

    Gong, Yubing ; Li, Quanyong ; Yang, D.G.

  • Author_Institution
    Dept. of Electron. Machinery & Traffic Eng., Guilin Univ. of Electron. Technol.
  • fYear
    2006
  • fDate
    26-29 Aug. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Generally, the thermal profile created for the reflow furnaces contains several distinct regions, namely the initial ramp, a dwell at elevated temperature, a ramp to the maximum temperature, and a cool down region. Because of the mismatch in coefficient of thermal expansion (CTE) of the components interconnected, the thermal strain and associated thermal stress are produced during reflow, which may lead to delamination in interfacial materials and nucleating of micro crack. Reducing the maximum thermal stress has a significant improvement on the reliability of solder joints. In this paper, a finite element model of a specific BGA contained electronic assembly was built and the thermal mechanic behavior of eutectic SnPb solder joint was simulated during reflow. Further, several critical reflow profile parameters, namely the peak reflow temperature, dwell time above liquids, soak time, ramp rate, conveyor speed, were optimized in order to minimize the maximum thermal stress in the whole electronic assembly. The simulation results shows that the maximum thermal stress can be reduced by the optimization of the several critical reflow profile parameters
  • Keywords
    ball grid arrays; delamination; finite element analysis; lead alloys; nucleation; reflow soldering; reliability; temperature distribution; thermal stress cracking; tin alloys; BGA; SnPb; critical reflow profile parameters; delamination; electronic assembly; eutectic solder joint; finite element model; interfacial materials; maximum thermal stress; microcrack nucleation; reflow furnaces; reflow soldering temperature profile; solder joints reliability; thermal expansion coefficient mismatch; thermal mechanic behavior; thermal strain; Assembly; Capacitive sensors; Delamination; Finite element methods; Furnaces; Lead; Reflow soldering; Temperature; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0619-6
  • Electronic_ISBN
    1-4244-0620-X
  • Type

    conf

  • DOI
    10.1109/ICEPT.2006.359831
  • Filename
    4198952