DocumentCode
2577018
Title
Numerical Simulation and Analysis for a New Thermal Conduction Scheme in Chip-on-Chip SiP
Author
Chen, Xiaojie ; Zhao, Xinyi ; Liu, Sheng
Author_Institution
Inst. of Microsyst., Huazhong Univ. of Sci. & Technol., Wuhan
fYear
2006
fDate
26-29 Aug. 2006
Firstpage
1
Lastpage
4
Abstract
System-in-package (SiP) provides an approach of multi-chip module (MCM), which encapsulates two or more chips in one system in order to realize smaller and lighter packaging size. A typical model SiP made of three-layer chips is studied in the paper. The model system is modified by attaching copper layers which take the advantage of its thermal dissipation and then finite element analyses are conducted to investigate the thermal-mechanical performance of the modified model. The performance between the modified model and other models is also compared by the analyses. The distribution of temperature investigated in the numerical simulation which is considered with the modified model shows that there have been a lower maximum temperature and a uniform distribution of temperature than that in the traditional model. It gives some advices to optimize thermal management of the packaging of the system. In the paper, the results of the analyses demonstrate the new thermal conduction scheme, chip-cooling-laminate-chip (CCLC), is a reasonable method for making better thermal management of the multi-chip system, and it supports the high reliability and low cost resolution in micro-machine, especially in micro medical and other high reliability instruments
Keywords
finite element analysis; heat conduction; system-in-package; temperature distribution; thermal management (packaging); chip-cooling-laminate-chip; chip-on-chip SiP; finite element analyses; high reliability instruments; micromedical instrument; modified model; multichip module; numerical simulation; system-in-package; temperature distribution; thermal conduction scheme; thermal dissipation; thermal management; thermal-mechanical performance; three-layer chips; Copper; Costs; Finite element methods; Joining processes; Numerical simulation; Packaging; Performance analysis; Temperature distribution; Thermal conductivity; Thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0619-6
Electronic_ISBN
1-4244-0620-X
Type
conf
DOI
10.1109/ICEPT.2006.359836
Filename
4198957
Link To Document