DocumentCode
2577070
Title
[Three invited talks]
Author
Nanya, T. ; Chakrabarty, Krishnendu ; Takeuchi, Ken
fYear
2012
fDate
18-19 Nov. 2012
Abstract
These tutorials discuss the following: Toward Dependability of Information Society; Test and DfT as Enablers for Dependable 3D Integrated Circuits; Highly Reliable Signal Processing Technologies for Dependable Solid-State Drives (SSDs).
Keywords
design for testability; integrated circuit testing; security of data; signal processing; three-dimensional integrated circuits; DfT; SSD; dependable 3D integrated circuit testing; dependable solid-state drives; design-for-testability; information society dependability; signal processing technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Dependable Computing (PRDC), 2012 IEEE 18th Pacific Rim International Symposium on
Conference_Location
Niigata
Print_ISBN
978-1-4673-4849-2
Electronic_ISBN
978-0-7695-4885-2
Type
conf
DOI
10.1109/PRDC.2012.27
Filename
6385062
Link To Document