DocumentCode
2577141
Title
System Reliability-Aware Energy Optimization for Network-on-Chip with Voltage-Frequency Islands
Author
Jianxian Zhang ; Duan Zhou ; Yintang Yang
Author_Institution
Sch. of Comput. Sci. & Technol., Xidian Univ., Xi´an, China
fYear
2013
fDate
7-8 Dec. 2013
Firstpage
117
Lastpage
122
Abstract
In this paper, a novel energy optimization algorithm for Network-on-Chip (NoC) based on voltage-frequency islands (VFIs) is proposed under the system reliability constraints. The proposed algorithm mainly includes the three processes of VFI partitioning, assignment and task mapping to reduce the energy consumption. A system reliability-aware mapping algorithm is proposed which employs a hybrid algorithm based on quantum-behaved particle swarm optimization and multi-neighborhood simulated annealing strategy. The optimum particles upon QPSO are further optimized by annealing operation mentioned above. Besides, the catastrophic operation is executed to enlarge the search scope and avoid getting into the local optimum. It minimizes the communication energy consumption of NoC system on the condition of meeting system reliability constraints. Experimental results show that the proposed algorithm is quite effective in optimizing energy consumption of NoC with voltage-frequency islands under system reliability constraints.
Keywords
circuit reliability; energy consumption; minimisation; network-on-chip; particle swarm optimisation; power aware computing; simulated annealing; NoC energy consumption optimization; QPSO; VFI assignment; VFI partitioning; VFI task mapping; communication energy consumption minimization; energy consumption reduction; multineighborhood simulated annealing strategy; network-on-chip; quantum-behaved particle swarm optimization; system reliability-aware energy optimization; system reliability-aware mapping algorithm; voltage-frequency islands; Algorithm design and analysis; Benchmark testing; Energy consumption; Partitioning algorithms; Reliability; Simulated annealing; Mapping; Network-on-Chip; System Reliability; Voltage-frequency Islands;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Science and Cloud Computing Companion (ISCC-C), 2013 International Conference on
Conference_Location
Guangzhou
Type
conf
DOI
10.1109/ISCC-C.2013.133
Filename
6973579
Link To Document