• DocumentCode
    2577211
  • Title

    Simulation and Testing of Multi-Channel Electron Multiplier Using LTCC/Thick Silver Cofired Structures

  • Author

    Feng Zheng ; George, Hubert ; Jones, W. Kinzy

  • Author_Institution
    Dept. of Mech. & Mater. Eng., Florida Int. Univ., Miami, FL
  • fYear
    2006
  • fDate
    26-29 Aug. 2006
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A novel multichannel electron multiplier for high power applications has been developed in LTCC technology. The dynode structure has been fabricated using alternating layers of cofired LTCC and thick (.2-.6 mm) Ag layers. The secondary electron emitter (SEE) material is sol gel processed nanosize (20 nm) MgO, which has been applied to the interior wall of the channel and fired to obtain the highest SEE emission. Micro (25-50 microns) cooling channels are fabricated into the thick Ag layer, allowing the Ag layer to provide both conduction and convective cooling. Resistors are integrated into the structure to provide the impedance drop between the applied voltage and each dynode plate. Monte Carlo simulation has been performed for box and grid and chevron-shaped structures. For a two dynode multiplier we have measured an electron multiplication factor of 1.6, although a bias is observed between the measurement and the simulation method
  • Keywords
    Monte Carlo methods; ceramic packaging; cooling; electron multipliers; magnesium compounds; secondary electron emission; silver; sol-gel processing; 0.2 to 0.6 mm; 20 nm; 25 to 50 microns; Ag; LTCC technology; MgO; Monte Carlo simulation; convective cooling; low temperature cofired ceramics; microcooling channels; multichannel electron multiplier; secondary electron emitter; sol gel processing; Cathodes; Ceramics; Coatings; Conducting materials; Cooling; Electron multipliers; Silver; Surface charging; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0619-6
  • Electronic_ISBN
    1-4244-0620-X
  • Type

    conf

  • DOI
    10.1109/ICEPT.2006.359848
  • Filename
    4198969