• DocumentCode
    2577279
  • Title

    Phase Stability Assessment and Microstructure Modification at Lead-free Solder Joint

  • Author

    Gao, F. ; Nishikawa, H. ; Takemoto, T.

  • Author_Institution
    Joining & Welding Res. Inst., Osaka Univ.
  • fYear
    2006
  • fDate
    26-29 Aug. 2006
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The microstructure modification of the solder joint formed between the OSP Cu substrate and Sn3.5Ag lead-free solder was explored in this paper. The 0.2Co0.1Ni additives were added into Sn3.5Ag solder matrix. And the refined bulk microstructure, namely, the depressed Sn-halo growth, was found, which could be interpreted by the eutectic growth theory and interaction behavior between the component elements. After soldering on Cu substrate, a large solubility of Co and Ni was found at Cu6Sn5-based IMC, which could be labeled by (Cu, Co, Ni)6Sn5. The thermodynamic assessment was carried out and revealed that the solubility of Co and Ni at Cu6 Sn5-based IMC could reduce the system energy and thus stabilize the system. The calculated results also implied a higher affinity of Ni/Sn and Co/Sn couples than that of Cu/Sn, which supplied another evidence of the phase stability of (Cu, Co, Ni)6Sn 5. The Ag3Sn + (Cu, Co, Ni)6Sn5 cluster structure was found in the solder matrix after soldering. After isothermal annealing, the Cu3Sn phase was remarkably depressed partly due to the more stable (Cu, Co, Ni)6Sn5 phase
  • Keywords
    cobalt alloys; copper alloys; nickel alloys; silver alloys; solders; solubility; tin alloys; Ag3Sn; CoNi; Cu6Sn5; isothermal annealing; microstructure modification; phase stability assessment; solder joints; Alloying; Environmentally friendly manufacturing techniques; Intermetallic; Lead; Microstructure; Soldering; Stability; Thermodynamics; Tin; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0619-6
  • Electronic_ISBN
    1-4244-0620-X
  • Type

    conf

  • DOI
    10.1109/ICEPT.2006.359852
  • Filename
    4198973