• DocumentCode
    2577288
  • Title

    Analysis of SER Improvement by Radiation Hardened Latches

  • Author

    Yano, Ken ; Hayashida, Takanori ; Sato, Toshinori

  • Author_Institution
    Dept. of Electron. Eng. & Comput. Sci., Fukuoka Univ., Fukuoka, Japan
  • fYear
    2012
  • fDate
    18-19 Nov. 2012
  • Firstpage
    89
  • Lastpage
    95
  • Abstract
    Soft error rate (SER) of various radiation hardened latches is analyzed by simulation. SER is estimated by modeling the variety of current pulses triggered by particle strikes such as neutrons from space or alpha particles using Monte Carlo method. By using proposed method, we show that SER of various latches is accurately analyzed without conducting irradiation experiments. As for the soft error tolerant latches, we use DICE, Path-exclusive, BISER and TMR latches. The DICE and Path-exclusive latches achieve soft error resilience by adopting local redundancy with feedbacks from cross coupled nodes, on the other hand, BISER and TMR latches archive soft error resilience by multiplexing vulnerable normal latches with the help of auxiliary circuit to mask error states. From our simulation results, it is confirmed that Path-exclusive latch is the most favorable radiation hardened latch design with limited delay, area and energy overhead.
  • Keywords
    Monte Carlo methods; flip-flops; radiation hardening (electronics); BISER latches; DICE latches; Monte Carlo method; SER improvement analysis; TMR latches; alpha particles; cross coupled nodes; local redundancy; particle strikes; path-exclusive latches; radiation hardened latches design; soft error rate; soft error tolerant latches; space particles; vulnerable normal latch multiplexing; Integrated circuit modeling; Latches; Logic gates; Radiation hardening; Random variables; Resilience; Tunneling magnetoresistance; Redundant system; Single Event Upset; Soft Error; Soft error simulation; Soft error tolerant latch;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing (PRDC), 2012 IEEE 18th Pacific Rim International Symposium on
  • Conference_Location
    Niigata
  • Print_ISBN
    978-1-4673-4849-2
  • Electronic_ISBN
    978-0-7695-4885-2
  • Type

    conf

  • DOI
    10.1109/PRDC.2012.9
  • Filename
    6385074