Title :
Comparative study of novel micromachined accelerometers employing MIDOS
Author :
Bochobza-Degani, O. ; Seter, D.J. ; Socher, E. ; Kaldor, S. ; Scher, E. ; Nemirovsky, Y.
Author_Institution :
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
Abstract :
In this paper the fabrication and characterization of a novel implementation of micromachined accelerometers is reported. The accelerometers employ a new sensing technique, the modulated integrative differential optical sensing (MIDOS), to sense the output displacements of their proof-mass. The fabrication process of the hybrid device, which consists a bulk micromachined mechanical part attached by indium bumps to a CMOS chip containing photodetectors and readout electronics, is presented. Several prototypes were fabricated and characterized. The differences between the prototypes are discussed in detail as well as the comparison between their measured characteristics (noise equivalent acceleration (NEA), bandwidth and linearity). The prototypes have demonstrated NEA ranging from 70 [/spl mu/g//spl radic/Hz] to 1 [mg//spl radic/Hz] with bandwidth of 1 kHz to 4 kHz, respectively.
Keywords :
CMOS integrated circuits; accelerometers; etching; micromachining; microsensors; photodetectors; photolithography; readout electronics; 1 to 4 kHz; CMOS chip; MIDOS method; anisotropic etching; bandwidth; bulk micromachined mechanical part; cantilever type; dual-beam type; fabrication; four-beam type; frequency response; hybrid device; implementation; indium bumps; linearity; micromachined accelerometers; modulated integrative differential optical sensing; noise equivalent acceleration; output displacements; photodetectors; photolithography; proof-mass; readout electronics; Accelerometers; Bandwidth; CMOS process; Indium; Optical device fabrication; Optical modulation; Optical sensors; Photodetectors; Prototypes; Readout electronics;
Conference_Titel :
Micro Electro Mechanical Systems, 1999. MEMS '99. Twelfth IEEE International Conference on
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5194-0
DOI :
10.1109/MEMSYS.1999.746754