Title :
Nanoscale variable resistance using interlayer sliding of multiwall nanotube
Author :
Akita, S. ; Nakayama, Y.
Author_Institution :
Dept. of Phys. & Electron., Osaka Prefecture Univ., Sakai, Japan
Abstract :
In this paper, we explore an open subject of the interlayer electrical conduction in multiwall carbon nanotubes as a function of overlapping length in terms of the development of the nanoscale displacement sensors.
Keywords :
carbon nanotubes; displacement measurement; electric breakdown; electric resistance; electric sensing devices; electrical conductivity; electrical contacts; C; interlayer electrical conduction; interlayer sliding; multiwall carbon nanotubes; nanoscale displacement sensors; nanoscale variable resistance; overlapping length; Breakdown voltage; Carbon nanotubes; Electric breakdown; Electric resistance; Electric variables measurement; Electrical resistance measurement; Electrodes; Force measurement; Scanning electron microscopy; Sensor systems;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2003. Digest of Papers. 2003 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-040-2
DOI :
10.1109/IMNC.2003.1268525
