DocumentCode
2577528
Title
Detailed film coefficient measurement on a simple large-scale semiconductor package geometry
Author
Boyle, M.T. ; Asante, K.A.
Author_Institution
Dept. of Mech. Eng., Maine Univ., Orono, ME, USA
fYear
1990
fDate
6-8 Feb 1990
Firstpage
89
Lastpage
94
Abstract
Detailed measurements of the surface film coefficient for a scaled-up package model are described. The importance of Reynolds number (Re ) and Grashof number (Gr ) for a correlation of Nusselt number is provided at the high end of the Reynolds number range applicable to the electronics cooling problem. The model surfaces are heated by driving a direct current through thin stainless steel strips that cover the surface. The temperature distribution on the underneath side of the strips is measured at approximately 180 locations by the use of resistive temperature sensors. The local heat transfer coefficient is obtained by performing an energy balance temperature sensor. An automatic data acquisition system is used for all temperature measurements. The results show the level of Gr /Re 2 at which buoyancy forces become important for modeling the electronics component heat transfer problem as well as the features of the Nusselt number distribution over the package and board surface
Keywords
cooling; packaging; Grashof number; Nusselt number; Nusselt number distribution; Reynolds number; automatic data acquisition system; buoyancy forces; direct current; electronics component heat transfer problem; electronics cooling problem; energy balance temperature sensor; film coefficient measurement; large-scale semiconductor package geometry; local heat transfer coefficient; resistive temperature sensors; scaled-up package model; surface film coefficient; temperature distribution; temperature measurements; thin stainless steel strips; Data acquisition; Electronics cooling; Electronics packaging; Heat transfer; Large-scale systems; Steel; Strips; Temperature distribution; Temperature measurement; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal and Temperature Measurement Symposium, 1990. SEMI-THERM VI, Proceedings., Sixth Annual IEEE
Conference_Location
Phoenix, AZ
Type
conf
DOI
10.1109/STHERM.1990.68496
Filename
68496
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